RHK Technology R9 Spectroscopy Webinar

Discover how the RHK Technology R9 Controller is redefining spectroscopy and advanced scanning probe microscopy research. In this webinar, RHK Technology President Adam Kollin showcases the revolutionary capabilities of the R9 Controller, including its patented Perfect Spec™ technology, ultra-low noise architecture, wide bandwidth performance, and advanced time-based data acquisition. Whether you're working with an SPM Controller, AFM controller, or STM Controller, this presentation demonstrates how the R9 enables more accurate, repeatable, and information-rich spectroscopic measurements. Learn how researchers can acquire and analyze massive datasets, optimize spectroscopy parameters, eliminate measurement uncertainty, and gain deeper insight into probe-sample interactions. The webinar explores innovative features such as integrated lock-in amplifiers, FPGA-based architecture, customizable user interfaces, simultaneous topographic and spectroscopic acquisition, and flexible measurement modes for nanoscience applications. You'll also see real-world examples of dI/dV spectroscopy, I-Z spectroscopy, high-speed signal acquisition, and advanced post-processing techniques that help researchers push beyond the limitations of conventional controllers. If you're involved in nanoscience instrumentation, scanning probe microscopy, spectroscopy, AFM, STM, or advanced materials characterization, this webinar will show how the Scanning probe microscope controller from RHK Technology can help accelerate discoveries, improve data quality, and maximize research productivity. 🔬 Learn more about the R9 Controller and see why researchers worldwide rely on RHK Technology for cutting-edge SPM and spectroscopy solutions. #RHKTechnology #R9Controller #SPMController #AFMController #STMController #ScanningProbeMicroscopeController #NanoscienceInstrumentation #Spectroscopy #ScanningProbeMicroscopy #ResearchTools Chapters 00:00 - Introduction to the R9 Controller and Perfect Spec™ 00:50 - R9 Hardware Architecture and Low-Noise Design 02:20 - FPGA Technology and Digital Signal Processing 04:22 - Expanding Research Possibilities with R9 05:08 - Ultra-Low Noise and High-Speed Data Acquisition 06:32 - Customizable User Interface and Researcher Workflow 07:54 - Spectroscopy Capabilities and Data Channels 08:38 - Time-Based Data Acquisition Explained 09:42 - Simultaneous Topographic and Spectroscopic Measurements 11:01 - Spectroscopy Point Selection Methods 14:16 - Big Data Acquisition and Analysis Tools 15:32 - Raw Data Preservation and Time-Based Processing 17:14 - Spectroscopy Challenges and Measurement Optimization 18:48 - Perfect Spec™ Technology Overview 20:36 - Improving Repeatability and Productivity 22:27 - Visualizing Hidden Experimental Data 23:30 - Perfect Spec™ Measurement Workflow 24:32 - Custom Measurement Modes and User Innovation 25:39 - IV and dI/dV Spectroscopy Modes 26:13 - Lock-In Amplifier Phase Offset Optimization 27:51 - Customer Results and Real-World Performance 29:17 - I-Z Spectroscopy and Data Visualization Tools 30:25 - RHK Technology Future Development and Summary 31:26 - Q&A: AFM, STM, and Spectroscopy Workflows 33:40 - Q&A: Time-Based Data Reanalysis and Artifact Correction 35:19 - Q&A: AFM Measurement Techniques 36:22 - Q&A: Programming, SDK, and System Validation 38:15 - Closing Remarks and Contact Information