Using RHK R9 to Identify & Eliminate Noise in SPM System
Learn how to diagnose, identify, and eliminate noise sources in advanced scanning probe microscopy systems with this in-depth webinar from RHK Technology. In this presentation, Kenneth Kollin, Product Manager for the R9 Controller, demonstrates practical techniques for troubleshooting signal quality issues in STM Controller, AFM controller, and other Scanning probe microscope controller applications. Discover how electrical interference, grounding issues, shielding problems, mechanical vibration, acoustic disturbances, and thermal drift can affect your microscopy data. You'll see real-world examples using the R9 Controller's powerful diagnostic tools, including the oscilloscope, spectrum analyzer, transient recorder FFT, and data logger. Learn how to identify common noise signatures such as 60 Hz interference, mechanical resonances, pump vibrations, RF pickup, and environmental disturbances. The webinar also features an educational FFT and frequency-domain analysis segment presented by RHK staff scientist Dr. Stefan Porin, explaining frequency resolution, sampling rates, aliasing, averaging techniques, and best practices for signal analysis. Whether you're working with an SPM Controller, STM Controller, AFM controller, or other nanoscience instrumentation, this session provides valuable troubleshooting strategies to improve measurement quality and system performance. Chapters 00:00 - Introduction and Webinar Overview 00:53 - Common Noise Sources in Scanning Probe Microscopy 03:22 - R9 Controller Diagnostic Tools Overview 05:03 - Oscilloscope and Spectrum Analyzer Examples 06:27 - Using the Data Logger for Thermal Drift Analysis 07:33 - Real-World Noise Source Identification Demo 08:28 - Finding and Eliminating 60 Hz Interference 11:21 - High-Frequency FFT and Resonance Detection 12:21 - FFT Fundamentals and Frequency-Domain Analysis 18:00 - FFT Averaging and Noise Reduction Techniques 21:10 - Measuring Controller Noise Floor with Averaging 23:25 - Summary of R9 Diagnostic Capabilities 24:25 - Q&A: Mechanical, Electrical, and Acoustic Noise Sources 26:38 - High-Frequency Noise and RF Interference Examples 29:30 - Low-Frequency Noise, Aliasing, and Windowing Effects 33:10 - Practical Noise Mitigation Strategies 35:07 - Step-by-Step Noise Troubleshooting Workflow 38:33 - Grounding, Shielding, and Harmonics Discussion 39:38 - Scanner-Induced Oscillations and Final Questions 40:30 - Webinar Conclusion and Closing Remarks
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