Perform on-wafer RF calibration – WMS Series Part 5 of 6

In this video, I demonstrate an on wafer network analyzer calibration to 50 GHz. Anytime you want to measure on-wafer S-parameters up to microwave frequencies, you will need to calibrate the RF fixture and probes such that S-parameter measurements will be referenced to the probe tips. As you may see here, we have millimeter wave heads, probe positioners, and an RF cable that goes to the 1 mm connectors on the infinity probes. All this plumbing needs to be invisible to the measurement. We do this using an impedance standard substrate, or ISS for short. This has known impedance structures like a short to ground, 50 ohms and thru lines of various lengths. This is part of a 6 part video series on wafer level measurements. Part 1: Introduction to Wafer-level Measurement Solutions (WMS)    • Introduction to Wafer-level Measurement So...   Part 2: Automated on-wafer millimeter wave measurements demo    • Automated on-wafer millimeter wave measure...   Part 3: Configure WaferPro Express for measurements and probing    • Configure WaferPro Express for measurement...   Part 4: Align wafer probes and create a wafer map    • Align wafer probes and create a wafer map ...   Part 5: Perform on-wafer RF calibration    • Perform on-wafer RF calibration – WMS Seri...   Part 6: Set up a measurement project with WaferPro Express    • Set up a measurement project with WaferPro...