Scanning Electron Microscope: Pt 2 of 6

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. This video is part 2 of a 6-part series. More information on the CMDITR wiki: http://depts.washington.edu/cmditr/me...