Embedded JTAG/Boundary Scan for Built-In Self Test

Latent structural faults may be undetectable by traditional functional test, manifesting themselves via system failures in the field. A new approach to Built-In Self Test (BIST) uses JTAG/boundary scan within system firmware, providing in-situ unparalleled test coverage and diagnostics. This webinar recording highlights the application of boundary scan for BIST, the technology, Test Access (TAP) controller firmware requirements, and much more. It is followed by a demonstration of embedded boundary scan on a live target.