Advancing EBSD for beam-sensitive materials: From noise to insights

Electron backscatter diffraction (EBSD) is a powerful technique for revealing detailed information about a sample’s microstructure, including crystal orientation and phase distribution at the nanoscale. With its high spatial resolution and robustness, EBSD has become widely used in mineralogy, solid-state chemistry, and other fields. However, like any method, EBSD has its own limitations. Because it requires a strong signal, EBSD demands high electron-beam doses that not every material can withstand. This makes it challenging to apply EBSD to beam-sensitive materials, such as organic perovskites, which are promising materials for solar-cell applications. In this webinar, we will present strategies for overcoming these limitations using the EDAX Clarity system with a hybrid-pixel detector, enabling low-dose EBSD on perovskites and other beam-sensitive materials, and demonstrate the insights obtained by combining this high-sensitivity system with spherical indexing in EDAX OIM Analysis.