Lecture 11: Atomic Force Microscopy
In this video, we explore Atomic Force Microscopy (AFM), a high-resolution imaging technique for analyzing surfaces at the nanoscale. We begin with an overview of Scanning Probe Microscopy (SPM) and Scanning Tunneling Microscopy (STM) to understand why and how AFM was developed. Learn the working principle, key components, and different imaging modes of AFM, along with its advantages, limitations, and real-world applications. The session concludes with troubleshooting tips and a demonstration. Stay tuned for nanoscale surface imaging!

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