TOF-SIMS: Introduction and Materials Applications by Dr. Andrew Giordani

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analysis technique that provides elemental and molecular information from the sample surface (10-20 Å) with high chemical sensitivity and high spatial resolution. Additionally, TOF-SIMS is a powerful depth profiling technique that utilizes multiple ion beams and parallel detection of all secondary ions to provide chemical information as a function of depth into the sample. TOF-SIMS can be equipped with a variety of ion beams for analysis or depth profiling in various materials applications. The most recent advancement in TOF-SIMS is the capability of MS/MS which enables confident molecular identification. The flexibility of TOF-SIMS makes it a valuable tool to investigate a wide range of materials from the surface to micrometers into the sample. In this webinar the fundamentals of TOF-SIMS will be introduced, along with applications to demonstrate how TOF-SIMS can be used in materials characterization.