Elevating Everyday Transmission Electron Microscopy with ClearView
This webinar introduces ClearView, the latest scintillator camera from Gatan, and the high-performance scintillator camera for elevating everyday microscopy. Learn how the new Frame Control mode helps maximize signal-to-noise in imaging and diffraction data, how to leverage the new sensor sub-area readout options for optimized in-situ experimentation, and how to collect hardware-synchronized 4D STEM data at up to 1,600 fps. Moreover, this webinar highlights new features found in DigitalMicrograph 3.6 that benefit the wide range of applications possible with ClearView.

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Live EELS Analysis Using CEMAS Samples

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Capturing low-dose images, in-situ video, and diffraction data with the Metro counting camera

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PLC Troubleshooting 101. Basic Steps to Diagnose and Fix Your Machine

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Detector development for advanced electron microscopy

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Google Generative AI Leader Certification Course – Pass the Exam!

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Astro-Camera and Binning: What does it do? And how does it work?

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AI Webinar - Closing the Loop: AI Driven Predictive Modeling for Printed Electronics

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The World's Most Important Machine

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Wind Resource Assessment Data Analysis Using MATLAB

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Real-time in-situ insights: Dynamic mapping with 4D STEM

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