Imaging the Ultrastructure of Interfaces Between Cells and Nanofabricated Surface Structures

This lecture focuses on imaging the ultrastructure of interfaces between cells and nanofabricated surface structures. We will introduce the basic principles of imaging using electrons or ions, specifically techniques such as Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), and Helium Ion Microscopy (HIM). Additionally, we will cover physical probing methods, including Atomic Force Microscopy (AFM). Extensive preparatory work, particularly cryo- and resin embedding methods combined with FIB milling, will also be discussed. This lecture is part of the lecture series: "Small Scale, Big Impact: The World of Bio-Nano Interactions" Speaker: Elmar Neumann (‪@FZJuelichDeResearch‬ )