FLASH TALK: Utilization of GCIB for Mitigating Surface Contamination and Enabling Depth Profiling

In this Flash Talk presentation, Bob Hengstebeck, Research Faculty at the Materials Research Institute (MRI), Penn State, speaks on the topic, "Utilization of GCIB for Mitigating Surface Contamination and Enabling Depth Profiling of Organic Films by XPS." In the realm of X-ray Photoelectron Spectroscopy (XPS) surface analysis, with a practical information depth of only a few nanometers, surface contaminants from sample handling can present a restriction on accurate analysis. This lightning talk introduces the innovative application of Gas Cluster Ion Beam (GCIB) technology as a gentle, yet highly effective method for cleaning and preparing samples prior to XPS analysis. GCIB offers unique advantages over conventional approaches by enabling the removal of organic contaminants without inducing significant sample damage or altering chemical states. The talk will highlight the principles behind GCIB, optimized parameters for diverse materials, and comparative case studies demonstrating improved spectral clarity and reproducibility. The FLASH TALK series showcases concise, high‑impact presentations on the analytical capabilities of the Materials Characterization Lab (MCL) at Penn State. The first set of talks premiered at Materials Day 2025 in the Materials Research Institute. To learn more about MCL capabilities please contact [email protected]. Subscribe to the Penn State MRI channel for more videos:    / pennstatemri   YouTube Playlist for the FLASH TALK Series:    • Flash Talk Series   Materials Characterization Lab (MCL) https://www.mri.psu.edu/mcl Materials Characterization Techniques https://www.mri.psu.edu/materials-cha... FOLLOW US: LinkedIn: /in/PennStateMRI YouTube: /c/PennStateMRI Instagram: @PennStateMRI Twitter: @PennStateMRI Subscribe to our mailings: https://www.mri.psu.edu/opt Penn State Materials Research Institute (MRI) https://www.mri.psu.edu/ Video Production Seana Wood / Penn State MRI